LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Electromagnetic wave/particle beam spectroscopic method and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Energy discriminating scatter imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Energy dispersion x-ray fluorescence analysis of chemical...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Enhancement of X-ray reflectometry by measurement of diffuse...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Enhancing resolution of X-ray measurements by sample motion

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Equipment for spectral radiology

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Estimating strengths of wooden supports by detecting...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Eucentric motion system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination method for the evaluation of location-dependent spec

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination of material samples

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Explosives detection using resonance fluorescence of bremsstrahl

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Extreme ultraviolet soft x-ray projection lithographic...