X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1980-12-16
1983-09-13
Anderson, Bruce C.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
G01N 2320
Patent
active
044046820
ABSTRACT:
Provided is a method for foreseeing the residual life of a structural member, making use of an X-ray, comprising: preparing a plurality of test pieces made of the same material and subjected to the same working and heat-treating conditions as the structural member to be examined of which the fatigue strength is in question; executing fatigue tests with said test pieces till failure under a plurality of different stress conditions; obtaining for each stress the relationship between the residual life of said test piece and the halfvalue width ratio of X-ray diffraction profile; determining, from the above-mentioned relationships, a first relationship region between the halfvalue width ratio and the residual life that is independent of the level of the stress; measuring the halfvalue width ratio of said structural member; and determining the residual life of said structural member from the measured halfvalue width ratio in accordance with said first relationship region.
REFERENCES:
patent: 3228238 (1966-01-01), Jentet
patent: 3631713 (1972-01-01), Marom et al.
patent: 3934138 (1976-01-01), Bens
Hayashi Makoto
Shimizu Tasuku
Anderson Bruce C.
Beall, Jr. Thomas E.
Berman Jack I.
Hitachi , Ltd.
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