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Radiation imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Radiation optical element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Radiation scatter apparatus and method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Radiographic sensitivity for detection of flaws and cracks

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Radioisotope based x-ray residual stress analysis apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Radiometric thickness measurement gage

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Rapid X-ray diffraction screening method of polymorph...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Reflective mirror for soft x-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Reflectivity and resolution X-ray dispersive and reflective stru

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Refractive X-ray arrangement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Refractive x-ray element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Rise time measurement for ultrafast X-ray pulses

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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