X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-10-22
1993-03-09
Hannaher, Constantine
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 70, 378 71, 378 84, 378 87, 378161, 378145, 378147, 378 58, 378 62, 250308, 250307, G01N 23207
Patent
active
051931044
ABSTRACT:
An X-ray volume analysis method of crystalline defects of a part (11), comprises the steps of positioning the part in the plane situated at equal distance from the focus of an X-ray source and a focusing plane (14); illuminating the part from a punctual X-ray source (10) by a beam of a large spectral width .DELTA..lambda. and of determined angular opening .DELTA..theta., the opening .DELTA..theta. of the beam being fixed by .DELTA..theta..ltoreq..DELTA..lambda./2d.cos.theta., d being the interreticular distance for the considered reticular planes; orienting the part (11) to obtain the diffraction on a chosen family of reticular planes (30); and collecting and analyzing the X-ray beam near the focusing plane or beyond.
REFERENCES:
patent: 3833810 (1974-09-01), Efanov et al.
patent: 4959548 (1990-09-01), Kupperman et al.
patent: 5016266 (1991-05-01), Meurtin
patent: 5093573 (1992-03-01), Mikoshiba et al.
patent: 5136624 (1992-08-01), Schneider et al.
Industrial Laboratory, vol. 45, No. 6, Jun. 1979, "Topographic X-Ray Camera", L. G. Shabel'Nikov, pp. 676-677.
Aristov et al., "Role of Entrance Slit in the X-Ray Section Topography of Single Crystals" Physica Status Solidi (a), vol. 62, No. 2 (Dec. 1980), pp. 431-440.
T. Kojima et al., "X-Ray Diffraction Microscopy of an Electronic Streak Camera System", Japanese Journal of Applied Physics, vol. 27, No. 7 (Jul. 1988), pp. 1331-1334.
Compagnie Francaise Thomson Houston-Hotchkiss Brandt, CH-A-488180.
Bastie Pierre
Hamelin Bernard
Centre National de la Recherche Scientifique
Chu Kim-Kwok
Hannaher Constantine
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