X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-05-30
1987-11-24
Tokar, Michael J.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
73808, 378 71, G01N 2320
Patent
active
047093838
ABSTRACT:
A method for evaluating a residual fatigue life of mechanical parts, consisting of the steps of grinding a surface layer of a mechanical part to be inspected by a minute amount to form an inspection surface, measuring half-width data of an X-ray diffraction intensity curve on the inspection surface, calculating a depth (do) of a fatigue damaged region from a graph of a half-width ratio (H/Ho) versus a depth (d) below the surface layer, and determining a fraction of fatigue life N/Nf on the basis of data of the depth (do) of the defective region versus the fraction of fatigue life N/Nf which were separately obtained from a test piece.
REFERENCES:
patent: 4287416 (1981-09-01), Kramer et al.
patent: 4402227 (1983-09-01), Hayashi et al.
patent: 4404682 (1983-09-01), Hayashi et al.
patent: 4426718 (1984-01-01), Hayashi et al.
Goto Touru
Konishi Takashi
Mitsubishi Jukogyo Kabushiki Kaisha
Raevis Robert R.
Tokar Michael J.
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