LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Calibration and alignment of X-ray reflectometric systems

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Calibration and alignment of X-ray reflectometric systems

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Calibration and alignment of X-ray reflectometric systems

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Calibration and alignment of X-ray reflectometric systems

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

CD-GISAXS system and method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Channel-cut monochromator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Characterization of three-dimensional distribution of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combination of X-ray diffractometer and solid state detector and

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combination wavelength and energy dispersive x-ray spectrometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combinatorial screening system and X-ray diffraction and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combinatorial X-ray diffractor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combined thermal analyzer and x-ray diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Combined X-ray reflectometer and diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compound refractive lens for x-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compound refractive X-ray lens

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compton backscatter gage

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compton scattered X-ray depth visualization, imaging, or...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compton scattered X-ray visualization, imaging, or...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Compton scattered X-ray visualization, imaging, or...