Method for determining unknown structure of crystal

Details Method for determining unknown structure of crystal Method for determining unknown structure of crystal

1994-06-14

1995-05-23

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 73, 250307, G01N 23223

Patent

active

054188296

ABSTRACT:
The method for determining unknown structure of a solid by means of corpuscular beams or electromagnetic waves, includes the steps of radiating first incident waves to the solid to thereby obtain first scattering waves. radiating second incident waves to the solid in the direction opposite to the direction in which the first scattering waves had travelled, to thereby obtain second scattering waves, and measuring the intensity of the second scattering waves and the direction in which the second scattering waves had travelled.

REFERENCES:
patent: 4074132 (1978-02-01), Ladell et al.
patent: 4553030 (1985-11-01), Tokiwai et al.
patent: 4788702 (1988-11-01), Howe et al.
patent: 5235523 (1993-08-01), Karen et al.
By S. Nagano, "Theory of reflection high-energy electron diffraction", Oct. 1990, vol. 42, No. 12, The American Physical Society, pp. 7363-7369.

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