Method for determining a gsm substance and/or a chemical...

Details Method for determining a gsm substance and/or a chemical... Method for determining a gsm substance and/or a chemical...

2007-07-10

2007-07-10

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S090000

Reexamination Certificate

active

10968327

ABSTRACT:
A method for determining a weight per unit area and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an X-radiation, scattered from a material sample, a detector signal corresponding to the gsm substance and/or the chemical composition of the material sample is generated and used for determining the weight per unit area and/or the chemical composition of the material sample. A device for determining a weight per unit area and/or a chemical composition of a material sample has a compact measurement head arranged unilaterally with respect to the material sample. This measurement head includes an X-radiation source and a detector arrangement integrated into the measurement head of at least one X-ray detector connected to a voltage supply and an evaluation unit.

REFERENCES:
patent: 4779621 (1988-10-01), Mattson
patent: 5420905 (1995-05-01), Bertozzi
patent: 5600700 (1997-02-01), Krug et al.
patent: 6775351 (2004-08-01), Rinaldi et al.

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