Method for identifying desired features in a crystal

Details Method for identifying desired features in a crystal Method for identifying desired features in a crystal

1998-06-30

2000-04-25

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 71, 378 73, 378 76, G01N 2320

Patent

active

06055293&

ABSTRACT:
A method for identifying desired features in an off-orientation crystal uses radiation, such as x-rays, directed toward the crystal in a first direction to detect a unique region in a first direction. Based on identifying the unique region, the location of a desired feature, such as a key growth line, is approximated. Radiation is then directed at the crystal in a second direction transverse to the first direction to determine the precise location of the desired feature. The method can be performed automatically by a programmed x-ray device.

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B. D. Cullity, Elements of X-Ray Diffraction, second edition (Reading, MA: Addison-Wesley, 1978), p. 233-280, 497-500.

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