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Technique for attentuating x-rays with very low spectral distort

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Thickness measurement gauge

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Thickness measurement with automatic correction for changes in c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Three dimensional imaging system using laser generated ultrashor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Three-dimensional imaging system using laser generated ultrashor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Tomographic imaging with concentric conical collimator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Tomographic inspection system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Tomographic method of x-ray imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reissue Patent

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Tomographic method of x-ray imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Total reflection X-ray diffraction micrographic method and appar

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Transmission mode X-ray diffraction screening system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Transmission system for synchrotron radiation light

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Tunable .theta.-2.theta. device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Tunable X-ray monochromator using transmission gratings

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Two-crystal X-ray spectrometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Two-dimensional compton profile imaging method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Two-dimensional small angle x-ray scattering camera

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Two-dimensional small angle x-ray scattering camera

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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