X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1990-11-28
1992-04-14
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 70, 378 72, 427 8, 427433, G01N 2320
Patent
active
051054540
ABSTRACT:
A method for estimating the press formability of galvannealed steel sheets provided, wherein: the values found by: ##EQU1## wherein I(.gamma.)=the total X-ray diffraction intensity of the .gamma. phase,
REFERENCES:
patent: 4064437 (1977-12-01), Hirose et al.
patent: 4764945 (1988-08-01), Abe
patent: 4895736 (1990-01-01), Sommer et al.
patent: 4913746 (1990-04-01), Marder et al.
Chohata Kazuaki
Hirose Yusuke
Kittaka Toshiharu
Nagatani Takeshi
Saito Minoru
Chu Kim-Kwok
Howell Janice A.
Nisshin Steel Co. Ltd.
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