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Method for checking semiconductor wafers and apparatuses for car

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for checking wafers having a lacquer layer for faults

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for determining solder quality

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for imaging printed circuit board component leads

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting electronic devices mounted on a circuit bo

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting filled state of via-holes filled with fill

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for inspecting stripped condition of electric wire

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for judging printing sheets

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for sensing the pattern side of microcircuit chips

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method for the operation of an opto-electronic sensor

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method of and apparatus for inspecting mounting of chip componen

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method of checking defects in patterns formed on photo masks

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method of detecting pattern defect and its apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method of inspecting reticles and apparatus therefor

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method of inspecting the ends of stacked cigarettes

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Methods and apparatus for optical product inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Microelectronics inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Monitoring the effect of read/write element on the effective opt

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Off-axis joint tranform correlator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Optical comparator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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