4. Optics: measuring and testing
  5. By configuration comparison
  6. With comparison to master, desired shape, or reference voltage
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Cigarette end group inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Cigarette end group inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Comparator mask for aperture measuring apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Compensating system for inspecting potentially warped printed ci

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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