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Adaptive tolerance reference inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Adaptor for measuring length optically for endoscope

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Advanced via inspection tool (AVIT)

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for detecting surface defects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for determining depth profile characteristi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for determining distortion of a welded memb

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for determining the thickness of insulated

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for dimensional weighing utilizing a mirror

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for dimensional weighing utilizing a rotati

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for identifying photomask pattern defects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for imaging fired ammunition

Optics: measuring and testing – By configuration comparison
Patent

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Apparatus and method for inspecting loading state of wafers in c

Optics: measuring and testing – By configuration comparison
Patent

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Apparatus and method for inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for measurement of the mechanical propertie

Optics: measuring and testing – By configuration comparison
Patent

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Apparatus and method for measurement of the mechanical...

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

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Apparatus and method for measuring an object

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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