4. Optics: measuring and testing
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Label inspection machine

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser scanning method and apparatus for rapid precision measurem

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser scanning method and apparatus for rapid precision measurem

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser-beam, pattern drawing/inspecting apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lead inspection system for surface-mounted circuit packages

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lead inspection system for surface-mounted circuit packages

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Linear filter based wavelength locking optical sub-assembly...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Linear-scanning, oblique-viewing optical apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lithography mask inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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