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Adaptive tolerance reference inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Advanced via inspection tool (AVIT)

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for automated game ball inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Apparatus and method for detecting surface defects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for determining distortion of a welded memb

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for identifying photomask pattern defects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus and method for testing liquid crystal display panel

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Apparatus and method for verifying the coplanarity of a ball gri

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for detecting defects in patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for detecting defects in patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for examining the external appearance of solid article

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for inspecting a phase shift mask

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for inspecting mask used for manufacturing integrated

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for inspecting repetitive patterns

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for inspection and dimensional measurement by sequenti

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Apparatus for measuring bend amount of IC leads

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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