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Electro-optical system for gauging surface profile deviations

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Electro-optical system for gauging surface profile deviations

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Electro-optical system for inspecting printed circuit boards

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Element recognition and orientation

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Exposure apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Exposure apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Exterior view inspecting apparatus for circuit board

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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