Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1986-03-19
1988-03-01
Eley, Timothy V.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 356398, G01B 1100
Patent
active
047281952
ABSTRACT:
The invention provides a novel system for imaging a component lead on an assembled printed circuit board. The system incorporates a light source for illuminating a substantial portion of a solder pad of the circuit board being inspected. A photoreceptor receives emissions reflected from the illuminated portion of said solder pad and generates an image representative thereof. This photoreceptor is arranged so that passage of a component lead through the component hole occludes or shadows a portion of the solder pad from which the photoreceptor would otherwise receive reflected emissions. The system has application in the testing of printed circuit boards prior to wave soldering.
REFERENCES:
patent: 4240750 (1980-12-01), Kurtz et al.
Cognex Corporation
Eley Timothy V.
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