Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1992-09-15
1994-03-08
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356372, 382 8, G01B 1100
Patent
active
052932206
ABSTRACT:
A method for inspecting the stripped condition of an electric wire permits inspection of electric wires having a tip portion of various configuration with high accuracy and reliability. In this method, stripped condition is judged to be good or not good by: illuminating a core 6 at a tip portion of the electric wire 4 and its vicinity by means of illumination means 11; imaging the core and its vicinity by means of imaging means 12, the imaging means disposed in opposite relation to the illumination means 11 with the electric wire 4 therebetween; determining coordinate position of stripped end of the sheath in an imaging plane using illumination data of a picture obtained by the imaging means; determining coordinate position of the tip end of the core 6 in the imaging plane, as well as shape of the core 6, such as inclination of the core 6; determining as to whether the coordinate position of the stripped end is within a standard range, whether length and thickness of the core are within a standard range, or whether strands come out of the core.
REFERENCES:
patent: 4649621 (1987-03-01), Dunsel et al.
Patent Abstracts of Japan, vol. 10, No. 22, Group No. P424 60-174962, publication date Jan. 28, 1986.
Fukuda Michio
Ichikawa Yoshihide
Evans F. L.
Sumitomo Wiring Systems Ltd.
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