4. Optics: measuring and testing
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Sample CD measurement system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Sample inspection apparatus and sample inspection method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Seal dispenser for fabricating liquid crystal display panel...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Solder joint inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System and method of inspecting connector coupling condition

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System and method of three-dimensional inspection of...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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System for inspecting pin grid arrays

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System for optically inspecting conditions of parts packaged on

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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System for testing a pattern recorded on a plate

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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