Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1991-02-15
1992-10-20
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 358106, G01B 1100, H04N 718
Patent
active
051574632
ABSTRACT:
A method for detecting defects in solder coatings on leads for electronic components maps the surface of the lead, detects light from the coated lead, and distinguishes defects in the coating based on the amount of reflected light.
REFERENCES:
patent: 4242702 (1980-12-01), Kuni et al.
patent: 4695157 (1987-09-01), Schoenbaum et al.
Brown Mark D.
Dawson Lavaughn J.
Kaiser Stephen B.
Barndt B. Peter
Donaldson Richard L.
Pham Hoa
Rosenberger Richard A.
Texas Instruments Incorporated
LandOfFree
Method for determining solder quality does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for determining solder quality, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining solder quality will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-195958