Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1998-04-29
1999-08-03
Kim, Robert H.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, G01B 1100
Patent
active
059332425
ABSTRACT:
The invention relates to a method of operating an opto-electronic sensor, in particular a light barrier, in which a light signal is transmitted by means of a light transmitter into a monitored region and a light receiver designed to receive transmitted and reflected light signals delivers a signal, the amplitude of which is investigated for the presence of an object in the monitored region, wherein an object detection signal is transmitted when an amplitude threshold value is exceeded or fallen short of, wherein, before taking the sensor into operation, the threshold is automatically set in dependence on amplitude values which occur in a predetermined measurement time interval in the context of an initialization process with an object-free monitored region, and is thereby adapted to the operating conditions which exist during the initialization process, or wherein the threshold value is automatically adjusted during the sensor operation in dependence on amplitude values which have occurred in a specific measurement time interval and are thereby adapted to the respectively prevailing operating conditions.
REFERENCES:
patent: 5841543 (1998-11-01), Guldi et al.
Blumcke Thomas
Kietz Daniel
Waslowski Kai
Kim Robert H.
Ratliff Reginald A.
Sick AG
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