4. Optics: measuring and testing
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Off-axis joint tranform correlator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical comparator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical detecting apparatus and coordinate inputting...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Optical device and inspection module

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Optical device for wavelength monitoring and wavelength control

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical inspection system based on spatial filtering using a...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Optical inspection system for cylindrical objects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical inspection system for solder joints and inspection metho

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical measuring method and an optical measuring apparatus for

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical method for detecting errors in shape

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical reticle inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optoelectronic comparison apparatus for structures on plane surf

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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