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Test apparatus, correction value managing method, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test apparatus, correction value managing method, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test apparatus, pattern generator, test method and pattern...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test apparatus, phase adjusting method and memory controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus, program and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test apparatus, program, and test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test apparatus, test vector generate unit, test method,...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test arrangement for assemblages of intergrated circuit blocks

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test arrangement for memory devices using a dynamic row for crea

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Test board for testing IC devices operating in merged data outpu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Test buffer design and interface mechanism for differential...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Test buffer design and interface mechanism for differential...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Test bus architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test bus architecture for embedded RAM and method of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test case generation with backward propagation of predefined...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test channel usage reduction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Test circuit and a redundancy circuit for an internal memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test circuit and circuit test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Test circuit and method for DC testing LSI capable of preventing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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