Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-03-25
2008-03-25
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C702S085000
Reexamination Certificate
active
10913763
ABSTRACT:
A test apparatus includes a test module including a correcting unit for correcting the timing at which the test signal is to be supplied to the device under test or a voltage level of the test signal to the device under test, a correction value holding unit for holding a correction value used for a correction by the correcting unit, and an identification information storing unit for storing test module identification information, which is identification information of the test module, a correction value database for storing the correction value to be held by the correction value holding unit of the test module identified by the test module identification information, in order that the correction value corresponds to the test module identification information, and control means for retrieving the correction value stored by the correction value database, wherein the correction value corresponds to the test module identification information stored by the identification information storing unit, and controlling the correction value holding unit to hold the correction value.
REFERENCES:
patent: 5712855 (1998-01-01), Goto et al.
patent: 5793815 (1998-08-01), Goodnow et al.
patent: 5884236 (1999-03-01), Ito
patent: 6496000 (2002-12-01), Jang
patent: 6549866 (2003-04-01), Bhatnagar
patent: 6573990 (2003-06-01), Anderson
patent: 7061648 (2006-06-01), Nakajima et al.
patent: 7064871 (2006-06-01), Yamagata et al.
patent: 0 566 823 (1993-10-01), None
patent: 6-148279 (1994-05-01), None
patent: 10-105385 (1998-04-01), None
patent: 2000-137057 (2000-05-01), None
patent: 2001-124817 (2001-05-01), None
patent: WO-02/075343 (2002-09-01), None
Patent Abstracts of Japan, Publication No.: 06-148279, Publication Date: May 27, 1994, 1 page.
Patent Abstracts of Japan, Publication No.: 2000-137057, Publication Date: May 16, 2000, 1 page.
Patent Abstracts of Japan, Publication No.: 2001-124817, Publication Date: May 11, 2001, 1 page.
Patent Abstracts of Japan, Publication No.: 10-105385, Publication Date: Apr. 24, 1998, 1 page.
Supplementary European Search Report issued in European Application No. EP 04 74 8125 dated Jul. 18, 2006, 3 pages.
International Search Report issued in International Application No. PCT/JP2004/010964 mailed on Nov. 16, 2004 and English translation thereof, 4 pages.
Advantest Corporation
Osha & Liang LLP
Ton David
LandOfFree
Test apparatus, correction value managing method, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test apparatus, correction value managing method, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus, correction value managing method, and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3959568