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Semiconductor integrated circuit device and its test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor integrated circuit device and method for monitorin

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor integrated circuit device and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and method of design...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and method of testing th

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device and method of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and method of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and test method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device and test method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit device capable of simultaneousl

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device capable of switching...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device capable of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device capable of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device comprising RAM with...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reissue Patent

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Semiconductor integrated circuit device comprising synchronous D

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor integrated circuit device equipped with read...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit device for display controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor integrated circuit device having a test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device having fail-safe...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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