Semiconductor integrated circuit device and method for monitorin

Details Semiconductor integrated circuit device and method for monitorin Semiconductor integrated circuit device and method for monitorin

1999-04-22

2000-10-24

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

G11C 2900

Patent

active

061382558

ABSTRACT:
A semiconductor integrated circuit device is disclosed, which has an internal circuit that operates during a normal operation on the basis of a reference signal and input signals supplied from the outside of the device. A detecting circuit detects the voltage level of the reference signal. When the detecting circuit has detected that the reference signal is at a predetermined voltage level that differs from a voltage level assumed during the normal operation, a transfer circuit transfers an internal signal in the internal circuit to the outside of the device, instead of the regular output signal of the internal circuit.

REFERENCES:
patent: 4459686 (1984-07-01), Toyoda
patent: 5734661 (1998-03-01), Roberts et al.

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