Semiconductor integrated circuit device having a test...

Details Semiconductor integrated circuit device having a test... Semiconductor integrated circuit device having a test...

2005-11-08

2005-11-08

Ton, David (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S743000

Reexamination Certificate

active

06964000

ABSTRACT:
32 pseudo-random numbers respectively indicated by 5 bits are successively generated in a test address generating unit, a serial output signal denoting one pair of pseudo-random numbers of 10 bits are input to 10 flip-flops serially arranged in an address shift register for each clock cycle, a read address expressed by a string of bits output from the flip-flops of odd-numbered stages is input to a read port of a RAM to perform a read test for one memory cell of the read address, and a write address expressed by a string of bits output from the flip-flops of even-numbered stages is input to a write port of the RAM to perform a write test for one memory cell of the write address. The read test and the write test for 32 memory cells are alternately performed in 64 clock cycles.

REFERENCES:
patent: 5033048 (1991-07-01), Pierce et al.
patent: 5420870 (1995-05-01), Kim
patent: 5506959 (1996-04-01), Cockburn
patent: 5592424 (1997-01-01), Maeno
patent: 5636225 (1997-06-01), Osawa
patent: 5815512 (1998-09-01), Osawa et al.
patent: 6338154 (2002-01-01), Kim
patent: 6654646 (2003-11-01), Bowers et al.
patent: 6769084 (2004-07-01), Kim et al.
J. Otterstedt, et al., “Detection of CMOS Address Decoder Open Faults with March and Pseudo Random Memory Tests”, IEEE, International Test Conference 1998 Proceedings, Paper 3.1, Oct. 18-23, 1998, pp. 53-62.

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device having a test... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device having a test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device having a test... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3461746