Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-05-23
2006-05-23
Decady, Albert (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C326S016000, C365S201000, C324S076590, C702S117000
Reexamination Certificate
active
07051254
ABSTRACT:
A semiconductor integrated device provided with a non-scan block being supplied with an input signal and supplying an output signal, and a selector, into which the input signal and the output signal of the non-scan block are input and which selects one of these signals as an externally output signal and outputs it. The selector is controlled such that it selects the input signal of the non-scan block when a scan test is performed and selects the output signal of the non-scan block when a scan test is not performed. Thus, during the scan test it is possible to control the input signal and observe the output signal of the scan block.
REFERENCES:
patent: 5172377 (1992-12-01), Robinson et al.
patent: 5404359 (1995-04-01), Gillenwater et al.
patent: 5450455 (1995-09-01), Hamilton et al.
patent: 5563507 (1996-10-01), Farwell
patent: 5706296 (1998-01-01), Whetsel
patent: 5774474 (1998-06-01), Narayanan et al.
patent: 5812561 (1998-09-01), Giles et al.
patent: 6374380 (2002-04-01), Sim
patent: 6515483 (2003-02-01), Porterfield
patent: 6725406 (2004-04-01), Kakizawa et al.
patent: 60-147659 (1985-08-01), None
patent: 63-255672 (1988-10-01), None
patent: 3-105269 (1991-05-01), None
patent: 6-118140 (1994-04-01), None
patent: 8-86836 (1996-04-01), None
patent: 2001-42008 (2001-02-01), None
De'cady Albert
Hamre Schumann Mueller & Larson P.C.
Trimmings John P.
LandOfFree
Semiconductor integrated circuit device and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor integrated circuit device and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device and method for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3651230