Semiconductor integrated circuit device comprising synchronous D

Details Semiconductor integrated circuit device comprising synchronous D Semiconductor integrated circuit device comprising synchronous D

1997-11-04

1999-06-08

Ganney, Vincent P.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

G06F 1100

Patent

active

059101814

ABSTRACT:
A semiconductor integrated circuit device includes a logic circuit and a synchronous dynamic random access memory including a core unit, integrated on a single semiconductor chip. The semiconductor integrated circuit device includes a synchronous dynamic random access memory control circuit which receives external control signals for the synchronous dynamic random access memory from the logic circuit, and outputs internal control signals to the core unit of the synchronous dynamic random access memory. For testing of semiconductor integrated circuit device, external test signals are provided through external terminals. The external test signals are selected by a selector, and are provided to the core unit of the synchronous dynamic random access memory for testing.

REFERENCES:
patent: 5629898 (1997-05-01), Idei et al.
patent: 5761149 (1998-06-01), Suzuki et al.

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