Semiconductor integrated circuit device and method of testing th

Details Semiconductor integrated circuit device and method of testing th Semiconductor integrated circuit device and method of testing th

1997-05-29

2000-04-25

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

714733, G01R 3128

Patent

active

060556552

ABSTRACT:
Functional circuits such as a processor, an SRAM, a DRAM and a flash-EEPROM are mounted on a semiconductor chip. Of these functional circuits, for example, the flash-EEPROM which fluctuates a potential of the semiconductor chip is separated from the other circuits by means of a separating region provided in the semiconductor chip. In addition, the separating region is put in contact with the entire side faces of the semiconductor chip.

REFERENCES:
patent: 4467400 (1984-08-01), Stopper
patent: 4742385 (1988-05-01), Kohmoto
patent: 4910735 (1990-03-01), Yamashita
patent: 5438542 (1995-08-01), Atsumi et al.
patent: 5491358 (1996-02-01), Miyata
patent: 5525912 (1996-06-01), Momohara
patent: 5608335 (1997-03-01), Tailliet
patent: 5663901 (1997-09-01), Wallace et al.
patent: 5721445 (1998-02-01), Singh et al.
patent: 5802270 (1998-09-01), Ko et al.
patent: 5818249 (1998-10-01), Momohara

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device and method of testing th does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device and method of testing th, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device and method of testing th will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1003174