Semiconductor integrated circuit device having fail-safe...

Details Semiconductor integrated circuit device having fail-safe... Semiconductor integrated circuit device having fail-safe...

2008-05-09

2011-11-08

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S048000, C714S718000, C714S719000, C714S754000, C714S764000, C365S185090, C365S185290, C365S185330, C365S200000, C365S201000

Reexamination Certificate

active

08055957

ABSTRACT:
An integrated circuit device contains a flash memory, a flash control unit for controlling the rewriting and reading on the flash memory, and a processor unit. The processor unit includes a normal mode and a fail-safe mode as the operating states. In normal mode, when a defect is detected during the verify operation after writing data onto the flash memory then any further use of the flash memory is stopped. In fail-safe-mode, when a defect is detected during the verify operation after writing data onto the flash memory, the error is corrected and flash memory usage continues. The operating state is normal mode, and when the verify operation detects a defect after normal mode erase operation, the operation shifts to fail-safe mode.

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