Semiconductor integrated circuit device capable of...

Details Semiconductor integrated circuit device capable of... Semiconductor integrated circuit device capable of...

2005-02-15

2005-02-15

Ton, David (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C327S143000, C324S076110

Reexamination Certificate

active

06857093

ABSTRACT:
The semiconductor integrated circuit device includes an internal power supply circuit placed between a prescribed one of a plurality of internal circuits and a power supply interconnection for converting a level of an external power supply potential to supply an internal power supply potential to the prescribed internal circuit, and a control circuit for conducting a self-test of the semiconductor integrated circuit device. The control circuit detects a current amount being supplied from the internal power supply circuit to the prescribed internal circuit. The detected result is externally output via a data input/output unit.

REFERENCES:
patent: 4814712 (1989-03-01), Burton et al.
patent: 5030845 (1991-07-01), Love et al.
patent: 5203867 (1993-04-01), Love et al.
patent: 5764655 (1998-06-01), Kirihata et al.
patent: 6104304 (2000-08-01), Clark et al.
patent: 02-157677 (1990-06-01), None
patent: 7-151817 (1995-06-01), None
patent: 11-31399 (1999-02-01), None

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