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Removing the effects of unknown test values from compacted...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Repair of address-specific leakage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Resetting latch circuits within a functional circuit and a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Residue number system arithmetic circuits with built-in self...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Resource management during system verification

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Response bits as stimulus in subdivided scan path delay test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Restricting the damaging effects of software faults on test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Resynchronization memory in series/parallel with...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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RFID tag with bist circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Runtime reconfiguration of reconfigurable circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Runtime-competitive fault handling for reconfigurable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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