Removing the effects of unknown test values from compacted...
Repair of address-specific leakage
Resetting latch circuits within a functional circuit and a...
Residue number system arithmetic circuits with built-in self...
Resource management during system verification
Response bits as stimulus in subdivided scan path delay test
Restricting the damaging effects of software faults on test...
Resynchronization memory in series/parallel with...
RFID tag with bist circuits
RFID tag with bist circuits
Runtime reconfiguration of reconfigurable circuits
Runtime-competitive fault handling for reconfigurable logic...