Repair of address-specific leakage

Details Repair of address-specific leakage Repair of address-specific leakage

2005-10-18

2005-10-18

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S710000, C714S718000, C365S201000

Reexamination Certificate

active

06957372

ABSTRACT:
An integrated circuit having a DRAM array connected to a power supply is tested for excessive current draw by selectively applying voltage to a single wordline or bitline, measuring current drawn, comparing the result with a reference number representing acceptable leakage, and replacing columns of the array having excessive leakage, thereby identifying and repairing latent defects that may become a cause of failure.

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