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Conversion of transition metal to silicide through back end...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Convex device with selectively doped channel

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Copper process compatible CMOS metal-insulator-metal...

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Core cell structure and corresponding process for NAND type...

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Corner clipping for field effect devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Corner rounding in a replacement gate approach based on a...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Corner rounding process for partial vertical transistor

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Corrugated post capacitor and method of fabricating using select

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Coupling well structure for improving HVMOS performance

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Covered slit isolation between integrated circuit devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Creating high voltage FETs with low voltage process

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Creating shallow junction transistors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Creation of a self-aligned, ion implanted channel region, after

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Cross leakage of capacitors in DRAM or embedded DRAM

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Crown capacitor using a tapered etch of a damascene lower electr

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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CU second electrode process with in situ ashing and...

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Current controlled field effect transistor

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Current limiting circuit with continuous metallization

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Current source bias circuit with hot carrier injection tracking

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CVD Ta2O5/oxynitride stacked gate insulator with TiN gate...

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