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Method for the characterization of lacquer coated plastic surfac

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for the operation of an opto-electronic sensor

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method of and apparatus for ascertaining the diameters of rod-sh

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for determining optical quality of an ar

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for forming multi-layer film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for inspecting mounting of chip componen

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method of and apparatus for inspecting residue of metal film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for inspecting the accuracy of a machine

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Patent

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Method of and apparatus for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and device for inspecting a PCB

Optics: measuring and testing – By configuration comparison – With relatively movable optical grids
Patent

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Method of checking defects in patterns formed on photo masks

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method of checking for the presence of connection balls

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Reexamination Certificate

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Method of detecting pattern defect and its apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method of establishing a measuring point for determining the thi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of examining microcircuit patterns

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of fabricating gradient index optical films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of inspecting a master member

Optics: measuring and testing – By configuration comparison
Patent

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Method of inspecting reticles and apparatus therefor

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method of inspecting the ends of stacked cigarettes

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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