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Selected: C

Calculation method and apparatus of exposure condition, and...

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Reexamination Certificate

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Calibrating implantable optical sensors

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

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Calibration method for printing plate picture pattern area meter

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Cigarette end group inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Cigarette end group inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Cluster tool layer thickness measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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CMP variable angle in situ sensor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Coating thickness measurement system and method of measuring a c

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Comparator mask for aperture measuring apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Comparison type dimension measuring method and apparatus using a

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
Patent

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Compensating system for inspecting potentially warped printed ci

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Computer joystick

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

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Computerized micromeasuring system and method therefor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contact-free optical linear measurement device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contactless thickness measuring apparatus and measuring method f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contour detecting and dimension measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contour inspection

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Cross-sectional area measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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