LandOfFree - US Patents - Listing for Optics: measuring and testing,By configuration comparison

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Off-axis joint tranform correlator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Patent

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Offset printing plate printing image area measuring device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical caliper with compensation for specimen deflection and me

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical comparator

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Patent

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Optical comparator with 3-D image

Optics: measuring and testing – By configuration comparison – With projection on viewing screen

Patent

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Optical detecting apparatus and coordinate inputting...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Reexamination Certificate

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Optical device and inspection module

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Reexamination Certificate

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Optical device for wavelength monitoring and wavelength control

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Patent

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Optical diffraction method and apparatus for integrated circuit

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...

Patent

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Optical extensometer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical film thickness measurement method, film formation method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical gaging system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical gaging system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical inspection system based on spatial filtering using a...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Reexamination Certificate

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Optical inspection system for cylindrical objects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Patent

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Optical inspection system for large parts and for multiple measu

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical inspection system for solder joints and inspection metho

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage

Patent

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Optical measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Optical measurement device and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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