Search
Selected: D

Defect detection through image comparison using relative...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defect inspection system for phase shift masks

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Depositing a material of controlled, variable thickness...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detection method using electromagnetic wave and detection...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detection of phase defects on photomasks by differential...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Detector pulse enhancement circuit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determination of dimensions of tubes

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determination of refractive index and thickness of thin layers

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determining photoresist parameters using optical metrology

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for determining an optical property of a mask

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for end-point monitoring used in the polishing

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device and method for observing and analyzing a stream of materi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for automatically determining the deviation between the s

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for contact-free thickness measurement

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for continuously measuring a transverse dimension of a th

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for evaluating wrinkles in a double rolled seam

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for improving the accuracy of optical measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for measuring a transverse dimension of a thread-like str

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for measuring dimensions of workpieces

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Device for measuring height of object

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.