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Particle detection on patterned wafers and the like

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Parts mounting inspection method

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
Patent

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Parts recognizing device for mounting machine

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern detection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern evaluation apparatus and a method of pattern evaluation

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern inspection method and system

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Pattern inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Pattern test device

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Photoelectric measurement of moving filamentary material

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Photoelectric smoke detector and disaster monitoring system usin

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Photoeletric type measuring method and device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Photomask inspection apparatus and method with improved defect d

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Photometric grinder and lathe gauge

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Plate scanner for printing plates

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Plate thickness measuring method and apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Polishing apparatus including thickness or flatness detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Position and orientation tracking system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Print quality control device for perfecting press

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Print scanner

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Procedure and means for measuring the thickness of a film-like o

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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