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Temperature-compensated laser measuring method and apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Test system for optical and electro-optical viewing systems

Optics: measuring and testing – By configuration comparison
Patent

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Test-glass changer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Testing method for subjects to be tested and a device for said m

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Testing opaque workpieces, particularly tiny or thin elongated o

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness measuring apparatus using light from slit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness measuring device for insulating glass

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thickness monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Thin film thickness and optimal focus measuring using reflectivi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thin film thickness monitor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Thin film thickness monitor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Three dimensional inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Tube diameter measuring apparatus and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Tube end squareness projector apparatus

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Patent

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Two-dimensional beam deflector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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