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Sample CD measurement system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Sample inspection apparatus and sample inspection method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Scale pattern arrangement

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
Patent

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Scanning optical system adapted for linewidth measurement in sem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Scanning ray beam generator for optical measuring device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Seal dispenser for fabricating liquid crystal display panel...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Seam inspection device

Optics: measuring and testing – By configuration comparison – With object being compared and scale superimposed
Patent

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Selection and control device for bars and relative method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Sensing device for ink film thickness in printing presses

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Sheet dimension measurement system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Shroud contact wear sensor in a turbo machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Sight glass and product cleaning system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Solder joint inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Spectrometer configured to provide simultaneous multiple...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Striation monitor and display system and method

Optics: measuring and testing – By configuration comparison
Patent

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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Surface properties detection by reflectance metrology

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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