Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1990-03-22
1992-04-28
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356381, 356445, 356448, G01B 1128
Patent
active
051081865
ABSTRACT:
A method of establishing a measuring location lying in an ink-free area for determining the thickness of a layer of dampening medium on the surface of an offset printing plate, which includes scanning the surface of the plate in a search run with a measuring head, and evaluating the thus obtained measurement data in a manner that a measuring location lies in a vertical zone of the offset printing plate with the smallest possible average area coverage, and a device for performing the method.
REFERENCES:
patent: 3028502 (1962-04-01), Schiffbauer et al.
patent: 3960451 (1976-06-01), Wirz et al.
patent: 4259590 (1981-03-01), Morris et al.
patent: 4441819 (1984-04-01), Takeuchi et al.
patent: 4512662 (1985-04-01), Tobias
patent: 4565450 (1986-01-01), Wirz et al.
patent: 4573798 (1986-03-01), Fujie et al.
patent: 4666306 (1987-05-01), Matsumoto
patent: 4681455 (1987-07-01), Jeschke et al.
patent: 4685074 (1987-08-01), May et al.
patent: 4787238 (1988-11-01), Seki et al.
patent: 4976545 (1990-12-01), Kipphan et al.
patent: 5050984 (1991-09-01), Kipphan et al.
Haase Josef
Joss Werner
Kipphan Helmut
Greenberg Laurence A.
Heidelberger Druckmaschinen AG
Lerner Herbert L.
Pham Hoa
Rosenberger Richard A.
LandOfFree
Method of establishing a measuring point for determining the thi does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of establishing a measuring point for determining the thi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of establishing a measuring point for determining the thi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1243113