Optics: measuring and testing – By configuration comparison
Patent
1987-03-10
1988-08-23
Rosenberger, R. A.
Optics: measuring and testing
By configuration comparison
356389, G01B 1100
Patent
active
047657430
ABSTRACT:
A method of inspecting a pattern of elements on a working plate includes producing a negative copy of the working plate and aligning the negative copy with a positive inspection plate having elements slightly larger than the elements of the working plate whereby flaws are revealed as light transmissive spots. The working plate and a negative inspection plate, having the elements slightly smaller than the elements of the working plate, are aligned and flaws are revealed as light transmissive spots.
REFERENCES:
patent: 3411007 (1968-12-01), Thompson
patent: 3711205 (1973-01-01), Tulk et al.
patent: 3758326 (1973-09-01), Hennings et al.
Krufka Frank S.
Wetzel Charles M.
Cooper Crystal
Hallacher L. L.
Irlbeck D. H.
RCA Licensing Corporation
Rosenberger R. A.
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