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Label inspection machine

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser based gaging system and method of using same

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser based roundness and diameter gaging system and method of u

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser calibration of IR sensors using pulsed signals

Optics: measuring and testing – By configuration comparison
Patent

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Laser dimension gauge

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser gauging of rotary cutting tools

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser measuring system for incremental assemblies

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser scanning method and apparatus for rapid precision measurem

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser scanning method and apparatus for rapid precision measurem

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Laser-based measurement apparatus and method for the on-line mea

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Laser-beam, pattern drawing/inspecting apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lead inspection system for surface-mounted circuit packages

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lead inspection system for surface-mounted circuit packages

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Lead width inspection system and methods

Optics: measuring and testing – By configuration comparison – With object being compared and scale superimposed
Reexamination Certificate

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Length measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Length-measuring device and exposure apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Light curtain apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Lighting and detection system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Linear backlighting system and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Linear filter based wavelength locking optical sub-assembly...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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