Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Patent
1980-10-08
1983-06-28
Punter, William H.
Optics: measuring and testing
By configuration comparison
With projection on viewing screen
356394, 356398, G01B 908, G01B 1100
Patent
active
043902782
ABSTRACT:
A method of and apparatus for inspecting the machined accuracy of a contour in a workpiece, e.g. machined by wire-cutting EDM, to form a desired contour therein make use of a light beam focused on a focal area on the workpiece and an optical lens and mirror system for projecting an optical image of the machined contour upon magnification on a display screen having predetermined indicia. The workpiece is positioned to locate a portion of the machined contour in the focal area in a predetermined X-Y coordinate system. A table carrying the workpiece is displaced by motors in response to drive signals furnished from an NC unit to displace the workpiece in the X-Y coordinate system so that the focal area effectively moves on the workpiece along a path of the desired contour and the light beam focussed thereon scans the machined contour. The projected image on the display screen representing the machined contour is monitored with reference to the indicia to determine a deviation of the machined contour from the desired contour one portion after another.
REFERENCES:
patent: 2629936 (1953-03-01), Cronstedt
patent: 3358557 (1967-12-01), Welch
patent: 3553456 (1971-01-01), Parks et al.
patent: 3909131 (1975-09-01), Waters
patent: 4289400 (1981-09-01), Kubota
Dubno Herbert
Inoue-Japax Research Incorporated
Punter William H.
Ross Karl F.
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