Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1996-08-12
2000-09-19
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356391, 356376, 356371, G01B 1100
Patent
active
061220655
ABSTRACT:
Apparatus and method for detecting surface defects on an article freely standing on a conveyer, which generate profile trace data corresponding to profile trace at a cross-section of the article. A surface shape inspection unit comprising an optical ranging system using laser and camera is provided for obtaining the profile trace data through triangulation-based derivation techniques. Base reference curves are derived from regular portions of the profile trace data. Profile trace data are compared to defect threshold curves to recognize a defect induced departure of the trace data with respect to the base reference curve and to produce a defect output signal. The apparatus and method according to the invention are particularly useful for detecting roughness, cavities, wane, missing wood and altered wood on lumber pieces which are conveyed at high speed.
REFERENCES:
patent: 4162126 (1979-07-01), Nakagawa et al.
patent: 4277803 (1981-07-01), Sano
patent: 4827142 (1989-05-01), Hatje
patent: 4847510 (1989-07-01), Douglas
patent: 5083867 (1992-01-01), Burk
patent: 5085516 (1992-02-01), Bertrand et al.
patent: 5177556 (1993-01-01), Rioux
patent: 5229835 (1993-07-01), Reinsch
Anglehart James
Centre de Recherche Industrielle Du Quebec
Font Frank G.
Ratliff Reginald A.
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