Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate
2007-09-18
2007-09-18
Stafira, Michael P. (Department: 2886)
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
Reexamination Certificate
active
10322422
ABSTRACT:
A device and a method for testing a liquid crystal display panel are disclosed in the present invention, which enable to conveniently inspect a cutting plane of an individual unit liquid crystal panel. The apparatus includes a first memory unit storing a reference image of an end portion of a reference panel taken through a camera, a second memory unit storing an observed image of an end portion of a cut unit liquid crystal display panel taken through the camera, a comparison/computation unit computing a difference value by comparing the reference image and the observed image, and a display unit displaying the difference value of the comparison/computation unit.
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Kim Ho-Kyun
Shin Sang-Sun
LG.Philips LCD Co. , Ltd.
McKenna Long & Aldridge LLP
Stafira Michael P.
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