Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1976-10-26
1979-08-28
McGraw, Vincent P.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
250223R, 250572, 356237, G01B 1124, G01N 2132
Patent
active
041659392
ABSTRACT:
An inspection system is disclosed for detecting dimensional tolerances, shape and cosmetic defects in containers. A conveyer carries the containers past an inspection point where at least one focused beam of radiant energy traverses the container's surface at a steep angle. The pattern of the surface is detected and evaluated by optical imaging techniques to determine the acceptability of the inspected container while maintaining a capability of making allowances for manufacturing tolerances of the relative position of the area under inspection with respect to a given reference point of the container. Means are also disclosed for initiating and terminating the inspection process dependent upon the translational position of the container with respect to the inspection system.
REFERENCES:
patent: 3131815 (1964-05-01), Mathias
patent: 3529169 (1970-09-01), Heaney et al.
patent: 3536899 (1970-10-01), Gebel
patent: 3749496 (1973-07-01), Hietanen et al.
patent: 3794427 (1974-02-01), Shibata et al.
Simmons Jorge E.
Woodrow Arthur F.
McGraw Vincent P.
TSN Company, Inc.
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